https://mediaserver.artifex-engineering.com/about/instancehttps://mediaserver.artifex-engineering.com/videos/localhttps://mediaserver.artifex-engineering.com/w/8qQiJHPsUfm7zZ2guYJehqhttps://mediaserver.artifex-engineering.com/lazy-static/thumbnails/58f4f575-d6d9-479f-85ff-011eb39b36ed.jpgLIV100 Single emitter contacting on laser bar - Chinese | Artifex EngineeringLIV100 Single emitter contacting on laser bar - Chinese | Artifex Engineeringhttps://mediaserver.artifex-engineering.com/static/streaming-playlists/hls/3c279732-21ad-44bc-8710-ffc82b89455c/65648165-77d2-4062-a0d7-03842837b6c9-master.m3u8https://mediaserver.artifex-engineering.com/videos/embed/8qQiJHPsUfm7zZ2guYJehq80022025-09-04T07:22:11.216ZYESArtifex Engineering GmbH & Co KG.NOhttps://mediaserver.artifex-engineering.com/w/1SWBLihAejStT52WusXtjnhttps://mediaserver.artifex-engineering.com/lazy-static/thumbnails/13a1a637-8fcf-4ea6-afe6-3e2b8b787e94.jpgOptical Power Monitor (OPM) | Artifex Engineering - ENThe OPM series of optical power monitors employs photodiodes for the measurement and monitoring of optical power from the UV to near IR. They are characterized by: - Fast response time at high signal-noise-ratio - Sensitivity - Wide dynamic range - Wide range of options regarding photodiode material and optical input Product: https://artifex-engineering.com/de/instrumente/optische-leistungsmonitore/ Website: https://artifex-engineering.com/ Linkedin: https://www.linkedin.com/company/artifex-engineering-gmbh-co-kghttps://mediaserver.artifex-engineering.com/static/streaming-playlists/hls/071cd8e1-2bf6-44cc-9a74-d3d0b33200ad/8bd8bad5-5bfe-4f83-b258-f821240e2f3b-master.m3u8https://mediaserver.artifex-engineering.com/videos/embed/1SWBLihAejStT52WusXtjn1980612025-10-20T09:19:42.180ZYESArtifex Engineering GmbH & Co KG.NOhttps://mediaserver.artifex-engineering.com/w/kCJq6NUPXzDUpxJ98EATdShttps://mediaserver.artifex-engineering.com/lazy-static/thumbnails/f5504590-c3da-40dd-9f73-c3d8fdf3161d.jpgOptical Power Monitor (OPM) | Artifex Engineering - CNOPM系列光功率监测器采用光电二极管，可测量和监测从紫外到近红外波段的光功率。其特点包括： - 高信噪比下的快速响应时间 - 灵敏度高 - 宽动态范围 - 丰富的光电二极管材料和光输入选择 产品：https://artifex-engineering.com/de/instrumente/optische-leistungsmonitore/ 网站：https://artifex-engineering.com/ 领英：https://www.linkedin.com/company/artifex-engineering-gmbh-co-kghttps://mediaserver.artifex-engineering.com/static/streaming-playlists/hls/9efe8cbc-970b-4493-ad59-ca5fc905ea26/5a2a697b-8a6b-4884-9b0a-a03ffea531ab-master.m3u8https://mediaserver.artifex-engineering.com/videos/embed/kCJq6NUPXzDUpxJ98EATdS198062025-10-20T09:53:19.007ZYESArtifex Engineering GmbH & Co KG.NOhttps://mediaserver.artifex-engineering.com/w/aex2fRaSKhEBJBm3a7kG2jhttps://mediaserver.artifex-engineering.com/lazy-static/thumbnails/a3dd496c-443a-4f97-99be-dc3dbfe64b09.jpgLaser Diode Characterization System (LIV100) | Artifex EngineeringPowerful short pulse test system for the characterization of laser diodes and LEDs at the chip, bar or submount level. The fast rise time with essentially no overshoot allows testing these thermally “naked” devices without undue thermal loading. The standard instruments are not capable of CW testing. Product: https://artifex-engineering.com/instruments/laser-diode-characterization-systems/liv100/ Website: https://artifex-engineering.com/ Linkedin: https://www.linkedin.com/company/artifex-engineering-gmbh-co-kghttps://mediaserver.artifex-engineering.com/static/streaming-playlists/hls/4ac608e3-ae22-4449-8025-725a42a37164/5e859aec-f6c7-4cff-94a1-b06998746bcc-master.m3u8https://mediaserver.artifex-engineering.com/videos/embed/aex2fRaSKhEBJBm3a7kG2j1920322025-10-23T10:50:25.763ZYESArtifex Engineering GmbH & Co KG.NOhttps://mediaserver.artifex-engineering.com/w/6Zd35kFfW79J1QMqY75Xofhttps://mediaserver.artifex-engineering.com/lazy-static/thumbnails/c1119291-6ab2-4720-947b-3e47788c8886.jpgLaser Diode Characterization System (LIV100) - Chinese | Artifex EngineeringPowerful short pulse test system for the characterization of laser diodes and LEDs at the chip, bar or submount level. The fast rise time with essentially no overshoot allows testing these thermally “naked” devices without undue thermal loading. The standard instruments are not capable of CW testing. Product: https://artifex-engineering.com/instruments/laser-diode-characterization-systems/liv100/ Website: https://artifex-engineering.com/ Linkedin: https://www.linkedin.com/company/artifex-engineering-gmbh-co-kghttps://mediaserver.artifex-engineering.com/static/streaming-playlists/hls/307a8168-5794-4848-bcef-f87395029046/81b3b09e-790c-4470-8545-3b4742056a23-master.m3u8https://mediaserver.artifex-engineering.com/videos/embed/6Zd35kFfW79J1QMqY75Xof222062025-10-23T11:39:26.551ZYESArtifex Engineering GmbH & Co KG.NOhttps://mediaserver.artifex-engineering.com/w/oiejSqzJLLHspbC5ctAe3Jhttps://mediaserver.artifex-engineering.com/lazy-static/thumbnails/e3be84b7-0d08-445d-8865-4e775788cc07.jpgHow to use the LIV Contact Card | EnglishHow to use Contact Card for the Laser Diode Characterization System from Artifex Engineering Product: https://artifex-engineering.com/instruments/laser-diode-characterization-systems/ Read our Wikipedia Article for more information: https://de.wikipedia.org/wiki/LIV-Charakterisierung Visit our Website: https://artifex-engineering.com/ Linkedin: https://www.linkedin.com/company/artifex-engineering-gmbh-co-kghttps://mediaserver.artifex-engineering.com/static/streaming-playlists/hls/b490e819-78a6-4fb7-9675-2166d12c9652/db4a4f1d-78ab-4417-8735-a6dfa4463ff4-master.m3u8https://mediaserver.artifex-engineering.com/videos/embed/oiejSqzJLLHspbC5ctAe3J85032025-10-23T11:42:45.812ZYESArtifex Engineering GmbH & Co KG.NOhttps://mediaserver.artifex-engineering.com/w/kjnkneq97onDh9Cqwt5NDuhttps://mediaserver.artifex-engineering.com/lazy-static/thumbnails/1c32053f-b593-41b9-b350-71e386a961d0.jpgHow to use the LIV Contact Card | ChineseHow to use Contact Card for the Laser Diode Characterization System from Artifex Engineering Product: https://artifex-engineering.com/instruments/laser-diode-characterization-systems/ Read our Wikipedia Article for more information: https://de.wikipedia.org/wiki/LIV-Charakterisierung Visit our Website: https://artifex-engineering.com/ Linkedin: https://www.linkedin.com/company/artifex-engineering-gmbh-co-kghttps://mediaserver.artifex-engineering.com/static/streaming-playlists/hls/9c6e2b7d-570e-41ea-8416-dfa3934c2b06/92f31a33-1048-4d35-9693-3c2f967aa081-master.m3u8https://mediaserver.artifex-engineering.com/videos/embed/kjnkneq97onDh9Cqwt5NDu85032025-10-23T11:47:42.536ZYESArtifex Engineering GmbH & Co KG.NOhttps://mediaserver.artifex-engineering.com/w/8hwLzHJJCudcfu7mWPh9iVhttps://mediaserver.artifex-engineering.com/lazy-static/thumbnails/06266dcb-109c-4805-b520-c52ed375adc8.jpgLIV100 Single emitter contacting on laser bar - English | Artifex EngineeringLIV100 Single emitter contacting on laser bar - English | Artifex Engineeringhttps://mediaserver.artifex-engineering.com/static/streaming-playlists/hls/3afed531-c5f8-44e7-9bb3-6d739cb9155f/f207288e-1d6f-47ad-9724-4311be75c3f5-master.m3u8https://mediaserver.artifex-engineering.com/videos/embed/8hwLzHJJCudcfu7mWPh9iV79082025-10-23T11:48:11.079ZYESArtifex Engineering GmbH & Co KG.NOhttps://mediaserver.artifex-engineering.com/w/iHmm2uS1fZXgJBPc3Lr9Qshttps://mediaserver.artifex-engineering.com/lazy-static/thumbnails/d4197f7b-2502-4685-bed1-6a6d66faced6.jpgLaser Diode Characterization System (LIV120) | Artifex Engineering | EnglishPowerful, low cost pulsed / QCW / CW test system for use in the lab as well as for OEM applications. Ideal for: - Diode characterization - Quality control of incoming goods - OEM We offer this source measurement unit (SMU) with a variety of end stages covering current ranges from 250mA up to 40A in a compact enclosure and up to 1200A in 19” rack enclosures. The LIV120 uses our extensive range of OPM150 laser power detector heads. The measurement cycle typically takes less than 1s including the data transfer to the host computer. Product: https://artifex-engineering.com/instruments/laser-diode-characterization-systems/liv120/ Website: https://artifex-engineering.com/https://mediaserver.artifex-engineering.com/static/streaming-playlists/hls/8f7163d7-ac21-4184-bbaf-c6c628be8942/7484fb49-ef4d-4a4e-8cda-04347086abb8-master.m3u8https://mediaserver.artifex-engineering.com/videos/embed/iHmm2uS1fZXgJBPc3Lr9Qs2070202025-10-23T12:03:32.838ZYESArtifex Engineering GmbH & Co KG.NOhttps://mediaserver.artifex-engineering.com/w/1rJpad6ViuKgTjG2QCX6gXhttps://mediaserver.artifex-engineering.com/lazy-static/thumbnails/2cad9cf0-89e9-4ba6-92c4-337fc0a7c034.jpgLaser Diode Characterization System (LIV120) | Artifex Engineering | ChinesePowerful, low cost pulsed / QCW / CW test system for use in the lab as well as for OEM applications. Ideal for: - Diode characterization - Quality control of incoming goods - OEM We offer this source measurement unit (SMU) with a variety of end stages covering current ranges from 250mA up to 40A in a compact enclosure and up to 1200A in 19” rack enclosures. The LIV120 uses our extensive range of OPM150 laser power detector heads. The measurement cycle typically takes less than 1s including the data transfer to the host computer. Product: https://artifex-engineering.com/instruments/laser-diode-characterization-systems/liv120/ Website: https://artifex-engineering.com/https://mediaserver.artifex-engineering.com/static/streaming-playlists/hls/0397b947-0bbe-4204-a88e-27e8404c4669/ff2cdcc2-746a-4f0c-b572-00220a297240-master.m3u8https://mediaserver.artifex-engineering.com/videos/embed/1rJpad6ViuKgTjG2QCX6gX207052025-10-23T12:06:43.256ZYESArtifex Engineering GmbH & Co KG.NOhttps://mediaserver.artifex-engineering.com/c/artifex_engineering_channel/videoshttps://mediaserver.artifex-engineering.com/a/artifex_engineering/video-channels